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-rw-r--r--chapters/ediffract.tex6
1 files changed, 3 insertions, 3 deletions
diff --git a/chapters/ediffract.tex b/chapters/ediffract.tex
index d03a1d5..9a4fd9f 100644
--- a/chapters/ediffract.tex
+++ b/chapters/ediffract.tex
@@ -131,7 +131,7 @@ crystallographic directions in the graphite crystal.}
\end{figure}
\subsection*{Data acquisition}
-Acceptable power supplie settings:
+Acceptable power supply settings:
\\\begin{tabular}{lll}
Filament Voltage& $V_F$&6.3 V ac/dc (8.0 V max.)\\
Anode Voltage & $V_A$& 1500 - 5000 V dc\\
@@ -162,7 +162,7 @@ where the distance between the target and the screen $L = 0.130$~m is controlled
The ratio between the arc length and the distance between the target and the
radius of the curvature of the screen $R = 0.066$~m gives the angle $\phi$ in
-radian: $\phi = s/2R$. To measure $\phi$ carefully place a piece of masking tape on the tube so that it crosses the ring along the diameter. Mark the position of the ring for each accelerating voltage, and then remove the masking tape and measure the arc length $s$ corresponding to each ring. You can also make these markings by using the thin paper which cash register reciepts are printed on.
+radian: $\phi = s/2R$. To measure $\phi$ carefully place a piece of masking tape on the tube so that it crosses the ring along the diameter. Mark the position of the ring for each accelerating voltage, and then remove the masking tape and measure the arc length $s$ corresponding to each ring. You can also make these markings by using the thin paper which cash register receipts are printed on.
\begin{figure}
@@ -197,7 +197,7 @@ and $d_{outer}=d_{11}=0.123$~nm.
is limited (the diffraction limit) by the wavelength of light ($\approx$ 400
nm). This means that we cannot resolve anything smaller than this by looking at
it with light (even if we had no limitation on our optical instruments). Since
-the electron wavelenght is only a couple of angstroms ($10^{-10}$~m), with
+the electron wavelength is only a couple of angstroms ($10^{-10}$~m), with
electrons as your ``light source'' you can resolve features to the angstrom
scale. This is why ``scanning electron microscopes'' (SEMs) are used to look at
very small features. The SEM is very similar to an optical microscope, except